مؤتمر
New Trends in Testing Electronic Products by Simulation During Design Using Programmable Rules, Circuit Analysis and AI
| العنوان: | New Trends in Testing Electronic Products by Simulation During Design Using Programmable Rules, Circuit Analysis and AI |
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| المؤلفون: | Bot, Yizhak, Segal, Amir |
| المصدر: | 2024 Annual Reliability and Maintainability Symposium (RAMS) Reliability and Maintainability Symposium (RAMS), 2024 Annual. :1-7 Jan, 2024 |
| Relation: | 2024 Annual Reliability and Maintainability Symposium (RAMS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350307696 |
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| تدمد: | 25770993 |
| DOI: | 10.1109/RAMS51492.2024.10457651 |