General Model for Manufacturing Defect Detection Crossing Multiple Products

التفاصيل البيبلوغرافية
العنوان: General Model for Manufacturing Defect Detection Crossing Multiple Products
المؤلفون: Zhou, Longfei, Qin, Zhanghao, Xia, Ping, Liu, Jiabao, Cheng, Weihao, Li, Yunwei, Ying, Leyi, Liu, Qian, Liu, Mengxin, Song, Gezhang, Huang, Zebo, Hao, Zhou
المصدر: 2023 International Conference on Machine Learning and Applications (ICMLA) ICMLA Machine Learning and Applications (ICMLA), 2023 International Conference on. :1595-1600 Dec, 2023
Relation: 2023 International Conference on Machine Learning and Applications (ICMLA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350345346
تدمد:19460759
DOI:10.1109/ICMLA58977.2023.00241