مؤتمر
CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits
| العنوان: | CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits |
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| المؤلفون: | Liu, Yanfang, Xing, Wei W. |
| المصدر: | 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2024 29th Asia and South Pacific. :386-391 Jan, 2024 |
| Relation: | 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350393545 |
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| تدمد: | 2153697X |
| DOI: | 10.1109/ASP-DAC58780.2024.10473819 |