Modulation Of HCI in I/O analog devices Through Process Specifications

التفاصيل البيبلوغرافية
العنوان: Modulation Of HCI in I/O analog devices Through Process Specifications
المؤلفون: Diouf, C., Federspiel, X., Bravaix, A., Doyen, C., Yon, V., Basset, L., Garros, X.
المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-8 Oct, 2023
Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350327274
تدمد:23748036
DOI:10.1109/IIRW59383.2023.10477633