مؤتمر
Modulation Of HCI in I/O analog devices Through Process Specifications
العنوان: | Modulation Of HCI in I/O analog devices Through Process Specifications |
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المؤلفون: | Diouf, C., Federspiel, X., Bravaix, A., Doyen, C., Yon, V., Basset, L., Garros, X. |
المصدر: | 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-8 Oct, 2023 |
Relation: | 2023 IEEE International Integrated Reliability Workshop (IIRW) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350327274 |
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تدمد: | 23748036 |
DOI: | 10.1109/IIRW59383.2023.10477633 |