التفاصيل البيبلوغرافية
| العنوان: |
TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFET Devices |
| المؤلفون: |
Neuendank, Jereme, Al Mamun, Fahad, Barnaby, Hugh, Bonaldo, Stefano, Spear, Matthew, Wallace, Trace, Loveless, Daniel, Pew, Jacob, Nour, Mohamed, Manos, Pete, Giorno, Zach, Suriono, Usman, Chambers, Mike, Kosier, Steve |
| المصدر: |
2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-5 Oct, 2023 |
| Relation: |
2023 IEEE International Integrated Reliability Workshop (IIRW) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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