مؤتمر
Analytical Model of SRAM VMin to Predict Reliability and Process Impact
| العنوان: | Analytical Model of SRAM VMin to Predict Reliability and Process Impact |
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| المؤلفون: | Kumar, Tanuj, Cacho, Florian, Roy, Tanmoy, De La Bardonnie, Marc, Pelle, Servan, Giner, Fabien |
| المصدر: | 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023 |
| Relation: | 2023 IEEE International Integrated Reliability Workshop (IIRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350327274 |
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| تدمد: | 23748036 |
| DOI: | 10.1109/IIRW59383.2023.10477717 |