دورية أكاديمية
Electrical Stress on the CMOS Inverters Made by Junctionless Gate-All-Around Transistors
| العنوان: | Electrical Stress on the CMOS Inverters Made by Junctionless Gate-All-Around Transistors |
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| المؤلفون: | Chang, W., Yang, C., Ho, Y., Wang, C., Shen, W. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2863-2868 May, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2024.3376310 |