التفاصيل البيبلوغرافية
| العنوان: |
X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology |
| المؤلفون: |
Harith, Ashrith S, Liu, Yingdi, Mukherjee, Nilanjan, Mayer, Jeff |
| المصدر: |
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID), 2024 37th International Conference on. :718-723 Jan, 2024 |
| Relation: |
2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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