دورية أكاديمية
Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
| العنوان: | Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs |
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| المؤلفون: | Zhang, Y., Wong, V.H., Kalker, S., Caruso, A., Ruppert, L., Iannuzzo, F., de Doncker, R.W. |
| المصدر: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(9):11583-11595 Sep, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 08858993 19410107 |
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| DOI: | 10.1109/TPEL.2024.3382891 |