التفاصيل البيبلوغرافية
| العنوان: |
A comprehensive methodology for criticality assessment of microvias in printed circuit board assemblies |
| المؤلفون: |
Kamble, Vikram G, Patel, Dhaval Rasheshkumar, Schipfer, Christian, Thalhamer, Andreas, Zuendel, Julia, Krivec, Thomas, Antretter, Thomas, Fuchs, Peter Filipp |
| المصدر: |
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024 25th International Conference on. :1-7 Apr, 2024 |
| Relation: |
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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