دورية أكاديمية
Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution
العنوان: | Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution |
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المؤلفون: | Sajadi, R., Ugur, E., Farhadi, M., Vankayalapati, B.T., Saadat, A., Vandenberghe, W.G., Akin, B. |
المصدر: | IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 14(5):851-861 May, 2024 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 21563950 21563985 |
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DOI: | 10.1109/TCPMT.2024.3385312 |