دورية أكاديمية

Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution

التفاصيل البيبلوغرافية
العنوان: Third Quadrant Operation of SiC MOSFETs: Comprehensive Analysis and Condition Monitoring Solution
المؤلفون: Sajadi, R., Ugur, E., Farhadi, M., Vankayalapati, B.T., Saadat, A., Vandenberghe, W.G., Akin, B.
المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 14(5):851-861 May, 2024
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:21563950
21563985
DOI:10.1109/TCPMT.2024.3385312