دورية أكاديمية
Noise Analysis Directly on Shearography Wrapped Phase Maps
| العنوان: | Noise Analysis Directly on Shearography Wrapped Phase Maps |
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| المؤلفون: | Staub, D., Fantin, A.V., Willemann, D.P., Benedet, M.E., Cabral, T.D., d'Almeida, A.L.F.S., Armando Albertazzi, G. |
| المصدر: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-9 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189456 15579662 |
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| DOI: | 10.1109/TIM.2024.3352694 |