A Hardware-Friendly Fast VVC Test Zone Search Algorithm Using Machine Learning

التفاصيل البيبلوغرافية
العنوان:	A Hardware-Friendly Fast VVC Test Zone Search Algorithm Using Machine Learning
المؤلفون:	Viana, Ramiro, Sagrilo, Fernando, Ferreira, Rafael, Loose, Marta, Porto, Marcelo, Correa, Guilherme, Agostini, Luciano
المصدر:	2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS) Circuits and Systems (LASCAS), 2024 IEEE 15th Latin America Symposium on. :1-5 Feb, 2024
Relation:	2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS)
قاعدة البيانات:	IEEE Xplore Digital Library