مؤتمر
FET Junction Temperature Monitoring Using Novel On-Chip Solution
العنوان: | FET Junction Temperature Monitoring Using Novel On-Chip Solution |
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المؤلفون: | Narwal, Ramandeep, Agarwal, Aditi, Cheng, Tzu-Hsuan, Baliga, B. Jayant, Bhattacharya, Subhashish, Hopkins, Douglas C. |
المصدر: | 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2024 IEEE. :2475-2482 Feb, 2024 |
Relation: | 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350316643 9798350316636 |
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تدمد: | 24706647 |
DOI: | 10.1109/APEC48139.2024.10509157 |