FET Junction Temperature Monitoring Using Novel On-Chip Solution

التفاصيل البيبلوغرافية
العنوان: FET Junction Temperature Monitoring Using Novel On-Chip Solution
المؤلفون: Narwal, Ramandeep, Agarwal, Aditi, Cheng, Tzu-Hsuan, Baliga, B. Jayant, Bhattacharya, Subhashish, Hopkins, Douglas C.
المصدر: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2024 IEEE. :2475-2482 Feb, 2024
Relation: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350316643
9798350316636
تدمد:24706647
DOI:10.1109/APEC48139.2024.10509157