Insulator Micro-Defect Recognition Based on Improved YOLOv7 Model

التفاصيل البيبلوغرافية
العنوان: Insulator Micro-Defect Recognition Based on Improved YOLOv7 Model
المؤلفون: Liu, Zhili, Tang, Hong, Zheng, Weigang, Lu, Xuchen, Huang, Fucun, Yu, Bingbing
المصدر: 2023 International Conference on Internet of Things, Robotics and Distributed Computing (ICIRDC) ICIRDC Internet of Things, Robotics and Distributed Computing (ICIRDC), 2023 International Conference on. :454-458 Dec, 2023
Relation: 2023 International Conference on Internet of Things, Robotics and Distributed Computing (ICIRDC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350375275
DOI:10.1109/ICIRDC62824.2023.00089