التفاصيل البيبلوغرافية
| العنوان: |
A Neural Network based Fast Parameter Extraction of Compact Hot Carrier Degradation Model in FinFETs |
| المؤلفون: |
Shen, Cong, Li, Yu, Dai, Wu, Zhang, Xinyue, Wang, Zirui, Ji, Zhigang, Zhang, Lining, Wang, Runsheng, Huang, Ru |
| المصدر: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024 |
| Relation: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
