A Comprehensive SPICE Modeling Methodology for Hot-carrier Degradation

التفاصيل البيبلوغرافية
العنوان: A Comprehensive SPICE Modeling Methodology for Hot-carrier Degradation
المؤلفون: Monga, Udit, Gogineni, Usha, Hetzel, Ines, Jin, Chong, Steinmair, Alexander
المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024
Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350371529
DOI:10.1109/EDTM58488.2024.10511396