التفاصيل البيبلوغرافية
| العنوان: |
Ultra-Fast Oxide Traps in Sub-20-nm DRAM Technology: from Characterization to Physical origin identification |
| المؤلفون: |
Wang, Da, Liu, Yong, Xue, Yongkang, Ren, Pengpeng, Sun, Zixuan, Wang, Zirui, Liu, Yueyang, Cheng, Zhijun, Yang, Haiyang, Liu, Xiangli, Wu, Blacksmith, Cao, Kanyu, Wang, Runsheng, Ji, Zhigang, Huang, Ru |
| المصدر: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024 |
| Relation: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
