التفاصيل البيبلوغرافية
| العنوان: |
Exploring Charge Trapping Dynamics in Si:HfO₂-FeFETs by Temperature-Dependent Electrical Characterization |
| المؤلفون: |
Dahan, Mor Mordechai, Ber, Emanuel, Levit, Or, Mulaosmanovic, Halid, Dunkel, Stefan, Muller, Johannes, Beyer, Sven, Yalon, Eilam |
| المصدر: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024 |
| Relation: |
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
