التفاصيل البيبلوغرافية
| العنوان: |
Fault Detection and Classification in Semiconductor Manufacturing for Sensor Screening Using Multi-Layer Deep Neural Network |
| المؤلفون: |
Reddy, S S Mohan, Rakesh, K, Aluvala, Srinivas, Bindu, G., Husseen, Ahmad |
| المصدر: |
2024 International Conference on Distributed Computing and Optimization Techniques (ICDCOT) Distributed Computing and Optimization Techniques (ICDCOT), 2024 International Conference on. :1-4 Mar, 2024 |
| Relation: |
2024 International Conference on Distributed Computing and Optimization Techniques (ICDCOT) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
