التفاصيل البيبلوغرافية
| العنوان: |
Comparison of Deep Learning Technologies Applied to the Recognition of Defects in Cocoa Beans |
| المؤلفون: |
Espinal-Lanza, Rodrigo, Perdomo, Maria Elena, Sanchez-Palma, Jesus, Ordonez-Avila, Jose Luis |
| المصدر: |
2023 IEEE 41st Central America and Panama Convention (CONCAPAN XLI) Central America and Panama Convention (CONCAPAN XLI), 2023 IEEE 41st. :1-6 Nov, 2023 |
| Relation: |
2023 IEEE 41st Central America and Panama Convention (CONCAPAN XLI) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
