التفاصيل البيبلوغرافية
العنوان: |
Impedance Measurement Platform for Statistical Capacitance and Current Characteristic Measurements of Arrayed Cells with Atto-order Precision |
المؤلفون: |
Saito, Koga, Suzuki, Tatsuhiko, Mitsuda, Hidemi, Nozaki, Tsubasa, Mawaki, Takezo, Kuroda, Rihito |
المصدر: |
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-6 Apr, 2024 |
Relation: |
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |