التفاصيل البيبلوغرافية
| العنوان: |
Self-Heating Effect of Device-Circuit with Back-side Power Delivery Network beyond 3nm Node |
| المؤلفون: |
Zhao, Pan, Xu, Jinghan, Zhou, Taoyu, Zhao, Songhan, Liu, Naiqi, Li, Xinpeng, He, Yandong, Liu, Xiaoyan, Du, Gang |
| المصدر: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024 |
| Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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