On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS

التفاصيل البيبلوغرافية
العنوان:	On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS
المؤلفون:	Kim, J., Loveless, T. D., Pew, J., Young, R., Rcising, D., Nour, M., Manos, P., Chambers, M., Barnaby, H. J., Neucndank, J.
المصدر:	2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024
Relation:	2024 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library