Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers

التفاصيل البيبلوغرافية
العنوان:	Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers
المؤلفون:	Srinivasan, P., Gonzalez, O. H., Restrepo, O. D., Lestage, J., Syed, S., Taylor, W., Bandyopadhyay, A., Gall, M., Ludvik, S.
المصدر:	2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024
Relation:	2024 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library