Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays

التفاصيل البيبلوغرافية
العنوان: Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays
المؤلفون: Laguerre, J., Martin, S., Coignus, J., Carabasse, C., Bocquet, M., Andrieu, F., Grenouillet, L.
المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024
Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350369762
تدمد:19381891
DOI:10.1109/IRPS48228.2024.10529427