التفاصيل البيبلوغرافية
العنوان: |
Data Retention Insights from Joint Analysis on BEOL-Integrated HZO-Based Scaled FeCAPs and 16kbit 1T-1C FeRAM Arrays |
المؤلفون: |
Laguerre, J., Martin, S., Coignus, J., Carabasse, C., Bocquet, M., Andrieu, F., Grenouillet, L. |
المصدر: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024 |
Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |