التفاصيل البيبلوغرافية
العنوان: |
Measurement of the $D_{it}$ Changes Under BTI-Stress in 4H-SiC FETs Using the Subthreshold Slope Method |
المؤلفون: |
Steinmann, Philipp, Lichtenwalner, Daniel J., Stein, Shane, Park, Jae-Hyung, Das, Suman, Ryu, Sei-Hyung |
المصدر: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P58.SiC-1-P58.SiC-4 Apr, 2024 |
Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: |
IEEE Xplore Digital Library |