Thermal Analysis of High-Performance Server SoCs from FinFET to Nanosheet Technologies

التفاصيل البيبلوغرافية
العنوان:	Thermal Analysis of High-Performance Server SoCs from FinFET to Nanosheet Technologies
المؤلفون:	Kumar, Nitish, Sankatali, Venkateswarlu, Chen, Yukai, Brunion, Moritz, Mishra, Subrat, Gupta, Ankur, Singh, Pushpapraj, Catthoor, Francky, Myers, James, Ryckaert, Julien, Biswas, Dwaipayan
المصدر:	2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :8B.4-1-8B.4-8 Apr, 2024
Relation:	2024 IEEE International Reliability Physics Symposium (IRPS)
قاعدة البيانات:	IEEE Xplore Digital Library