التفاصيل البيبلوغرافية
| العنوان: |
PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors |
| المؤلفون: |
Joy, Soumitra, Joshi, Kaustubh, Zubair, Ahmad, Bader, Samuel, Peck, Jason, Beumer, Michael, Koirala, Pratik, Radosavljevic, Marko, Vora, Heli, Meric, Inanc, Then, Han Wui |
| المصدر: |
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :6B.1-1-6B.1-6 Apr, 2024 |
| Relation: |
2024 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
Full Text Finder