مؤتمر
Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation
العنوان: | Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation |
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المؤلفون: | Farias, Clayton R., Balen, Tiago R., Butzen, Paulo F. |
المصدر: | 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024 |
Relation: | 2024 IEEE 25th Latin American Test Symposium (LATS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9798350365559 |
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DOI: | 10.1109/LATS62223.2024.10534605 |