High-efficient and Comprehensive Modeling of MFIM Ferroelectric Tunnel Junctions for Non-volatile/Volatile Applications

التفاصيل البيبلوغرافية
العنوان: High-efficient and Comprehensive Modeling of MFIM Ferroelectric Tunnel Junctions for Non-volatile/Volatile Applications
المؤلفون: Li, Yu, Jiang, Hao, Yu, Jie, Zhao, Xuanyu, Wang, Xiaodong, Liu, Qihan, Wei, Yingfen, Liu, Qi, Liu, Ming
المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024
Relation: 2024 IEEE International Memory Workshop (IMW)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350306521
تدمد:25737503
DOI:10.1109/IMW59701.2024.10536918