Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions

التفاصيل البيبلوغرافية
العنوان:	Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions
المؤلفون:	Lederer, Maximilian, Muller, Franz, Hoffmann, Raik, Olivo, Ricardo, Raffel, Yannick, Yang, Shouzhuo, De, Sourav, Potjan, Roman, Ostien, Oliver, Altawil, Abdelrahman, Sunbul, Ayse, Lehninger, David, Kampfe, Thomas, Seidel, Konrad
المصدر:	2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024
Relation:	2024 IEEE International Memory Workshop (IMW)
قاعدة البيانات:	IEEE Xplore Digital Library