مؤتمر
On the Sensitivity of Analog Artificial Neural Network Models to Process Variation
| العنوان: | On the Sensitivity of Analog Artificial Neural Network Models to Process Variation |
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| المؤلفون: | Afroz, N., Sayem, A., Volanis, G., Maliuk, D., Stratigopoulos, H., Makris, Y. |
| المصدر: | 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024 |
| Relation: | 2024 IEEE 42nd VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350363784 |
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| تدمد: | 23751053 |
| DOI: | 10.1109/VTS60656.2024.10538718 |