مؤتمر
Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society
| العنوان: | Innovative Practices Session at VLSI Test Symposium 2024: Analog Testing Technologies for Digital Exploding Society |
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| المؤلفون: | Kobayashi, Haruo, Tsukahara, Naoki, Sato, Keno, Oshima, Takashi |
| المصدر: | 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-1 Apr, 2024 |
| Relation: | 2024 IEEE 42nd VLSI Test Symposium (VTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350363784 |
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| تدمد: | 23751053 |
| DOI: | 10.1109/VTS60656.2024.10538720 |