Transfer Learning of Arrival Time Prediction Models from a 65 nm to a 28 nm Process Node

التفاصيل البيبلوغرافية
العنوان: Transfer Learning of Arrival Time Prediction Models from a 65 nm to a 28 nm Process Node
المؤلفون: Shrestha, Pratik, Savidis, Ioannis
المصدر: 2024 IEEE 17th Dallas Circuits and Systems Conference (DCAS) Circuits and Systems Conference (DCAS), 2024 IEEE 17th Dallas. :1-6 Apr, 2024
Relation: 2024 IEEE 17th Dallas Circuits and Systems Conference (DCAS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350349535
تدمد:27665186
DOI:10.1109/DCAS61159.2024.10539903