مؤتمر
Investigating the Impact of Signal Resolution on Machine Learning Based Multi-Class Fault Detection
| العنوان: | Investigating the Impact of Signal Resolution on Machine Learning Based Multi-Class Fault Detection |
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| المؤلفون: | Akin, Vehbi, Mete, Mutlu |
| المصدر: | 2024 IEEE 17th Dallas Circuits and Systems Conference (DCAS) Circuits and Systems Conference (DCAS), 2024 IEEE 17th Dallas. :1-4 Apr, 2024 |
| Relation: | 2024 IEEE 17th Dallas Circuits and Systems Conference (DCAS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350349535 |
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| تدمد: | 27665186 |
| DOI: | 10.1109/DCAS61159.2024.10539911 |