دورية أكاديمية
Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges
| العنوان: | Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges |
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| المؤلفون: | Djenouri, Youcef, Srivastava, Gautam, Lin, Jerry Chun-Wei |
| المصدر: | IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 27(4):46-53 Jun, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 10946969 19410123 |
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| DOI: | 10.1109/MIM.2024.10540405 |