دورية أكاديمية
Analysis of Displacement Damage Induced by Silicon-Ion Irradiation in SiC MOSFETs
| العنوان: | Analysis of Displacement Damage Induced by Silicon-Ion Irradiation in SiC MOSFETs |
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| المؤلفون: | Wu, L., Dong, S., Liu, F., Liu, Z., Wei, Y., Li, W., Xu, X., Yang, J., Li, X. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(7):1370-1379 Jul, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2024.3408466 |