دورية أكاديمية
Study on the Degradation Mechanism of GaN MMIC Power Amplifiers Under On-State With High Drain Bias
| العنوان: | Study on the Degradation Mechanism of GaN MMIC Power Amplifiers Under On-State With High Drain Bias |
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| المؤلفون: | Zhang, H., Zheng, X., Lin, D., Hong, Y., Zhou, J., Lv, L., Cao, Y., Han, H., Zhang, W., Zhang, J., Ma, X., Hao, Y. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4530-4534 Aug, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2024.3409515 |