Low-Noise Wide Dynamic Range Charge Sensitive Amplifier in 65 nm CMOS Technology for the Second Flight of the GAPS Experiment

التفاصيل البيبلوغرافية
العنوان: Low-Noise Wide Dynamic Range Charge Sensitive Amplifier in 65 nm CMOS Technology for the Second Flight of the GAPS Experiment
المؤلفون: Ghislotti, Luca, Lazzaroni, Paolo, Manghisoni, Massimo, Riceputi, Elisa
المصدر: 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) Ph.D Research in Microelectronics and Electronics (PRIME), 2024 19th Conference on. :1-4 Jun, 2024
Relation: 2024 19th Conference on PhD Research in Microelectronics and Electronics (PRIME)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350386301
DOI:10.1109/PRIME61930.2024.10559720