التفاصيل البيبلوغرافية
| العنوان: |
Establishment of Degradation Model and Transfer Model for P-channel Power MOSFETs Under Negative Bias Temperature Stress |
| المؤلفون: |
Chen, Cen, Wang, Haodong, Yin, Haonan, Zheng, Wei, Zhai, Guofu |
| المصدر: |
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :4280-4284 May, 2024 |
| Relation: |
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
