مؤتمر
Reliability and Security of AI Hardware
| العنوان: | Reliability and Security of AI Hardware |
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| المؤلفون: | Gnad, Dennis, Gotthard, Martin, Krautter, Jonas, Kritikakou, Angeliki, Meyers, Vincent, Rech, Paolo, Rodriguez Condia, Josie E., Ruospo, Annachiara, Sanchez, Ernesto, Dos Santos, Fernando Fernandes, Sentieys, Olivier, Tahoori, Mehdi, Tessier, Russell, Traiola, Marcello |
| المصدر: | 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-10 May, 2024 |
| Relation: | 2024 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350349320 9798350349313 |
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| تدمد: | 15581780 |
| DOI: | 10.1109/ETS61313.2024.10567471 |