EMI Source Modeling Method Considering the Accurate Model of the Voltage Probe Based on CISPR25 Conducted EMI Testing

التفاصيل البيبلوغرافية
العنوان: EMI Source Modeling Method Considering the Accurate Model of the Voltage Probe Based on CISPR25 Conducted EMI Testing
المؤلفون: Su, Wenzhe, Li, Hong, Liu, Xueyang, Ji, Changlin, Wang, Zuoxing
المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :4971-4974 May, 2024
Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350351330
DOI:10.1109/IPEMC-ECCEAsia60879.2024.10567633