مؤتمر
Faulty Function Extraction for Defective Circuits
| العنوان: | Faulty Function Extraction for Defective Circuits |
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| المؤلفون: | Nigh, Chris, Purdy, Ruben, Li, Wei, Mitra, Subhasish, Blanton, R. D. |
| المصدر: | 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024 |
| Relation: | 2024 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350349320 9798350349313 |
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| تدمد: | 15581780 |
| DOI: | 10.1109/ETS61313.2024.10567760 |