التفاصيل البيبلوغرافية
| العنوان: |
Preconditioning for Accurate Threshold Voltage Extraction of SiC MOSFETs after AC Bias Temperature Instability in Reliability Tests |
| المؤلفون: |
Chen, Cen, Wang, Zicheng, Zhang, Ruyue, Ye, Xuerong, Zhang, Xiaosheng, Pan, Yanchen, Lai, Yaokang, Du, Jiangyuan |
| المصدر: |
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :4426-4430 May, 2024 |
| Relation: |
2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
