مؤتمر
Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact
| العنوان: | Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact |
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| المؤلفون: | Goel, Sandeep Kumar, Patidar, Ankita, Lee, Frank |
| المصدر: | 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-4 May, 2024 |
| Relation: | 2024 IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350349320 9798350349313 |
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| تدمد: | 15581780 |
| DOI: | 10.1109/ETS61313.2024.10567936 |