دورية أكاديمية
A Comprehensive Study of Transient Characteristics in FeFET Using In-Situ Vt Measurement Method
| العنوان: | A Comprehensive Study of Transient Characteristics in FeFET Using In-Situ Vt Measurement Method |
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| المؤلفون: | Myeong, I., Kim, H., Kim, W., Ha, D., Ahn, S., Song, J. |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(8):1457-1460 Aug, 2024 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/LED.2024.3417606 |