Machine Learning Approaches for IC Fault Localization and Diagnosis

التفاصيل البيبلوغرافية
العنوان: Machine Learning Approaches for IC Fault Localization and Diagnosis
المؤلفون: Saidala, Ravi Kumar, Dwivedi, Yagya Dutta, P, Aparna, Prasad, S. J. Suji, Dineshkumar, S., Hemalatha, R.
المصدر: 2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM) Science Technology Engineering and Mathematics (ICONSTEM), 2024 Ninth International Conference on. :1-6 Apr, 2024
Relation: 2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350365092
DOI:10.1109/ICONSTEM60960.2024.10568636