التفاصيل البيبلوغرافية
| العنوان: |
New Insights using Avalanche Mode for On-wafer Evaluation of SiC Diodes Technology and Design Ruggedness |
| المؤلفون: |
Abbas, Ahmad, Le Royer, Cyrille, Lavieville, Romain, Gningue, Saliou, Chouk, Rihab, Biscarrat, Jerome, Bano, Edwige, Godignon, Philippe |
| المصدر: |
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :176-179 Jun, 2024 |
| Relation: |
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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