التفاصيل البيبلوغرافية
| العنوان: |
Evaluation of Dynamic RON, Coss Loss, and Short-Circuit Ruggedness of 650V and 1200V Industrial Vertical GaN JFETs |
| المؤلفون: |
Yang, Xin, Song, Qihao, Zhang, Ruizhe, Wang, Bixuan, Pidaparthi, Subhash, Walker, Andy, Drowley, Cliff, Zhang, Yuhao |
| المصدر: |
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :283-286 Jun, 2024 |
| Relation: |
2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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